NARILIS - NISM lunch seminar | Dr. Peter Sjovall, RISE Research Institutes of Sweden

We are pleased to invite you to a seminar given by

Dr. Peter Sjövall

Research scientist at RISE Research Institutes of Sweden, Borås, Sweden

His seminar is entitled:

Biomolecular imaging in 2D and 3D by time-of-flight secondary ion mass spectrometry (ToF-SIMS)

Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is a surface analysis method capable of identifying and localising molecular species with high lateral resolution in a wide range of materials and samples. Furthermore, by combining 2D ToF-SIMS imaging with ion etching using Ar cluster ion sputtering, 3D molecular distributions of the surface region can be mapped in organic samples. At RISE, we have used ToF-SIMS in > 25 years for the analysis of a variety of samples, with a clear emphasis on biological samples. In this presentation, I will give examples of results from studies of four different types of samples:

• Parallel imaging of amyloid-b aggregates and lipids in transgenic Alzheimer’s disease mouse brains
• Penetration of exogenous compounds in human ex vivo skin
• 3D mapping of molecular components in food emulsions – milk, cream and oat-based cream analogue
• Preservation of biomolecular residues in multi-million-year-old fossils

Invited by Prof. Laurent Houssiau (NISM) and Prof. Charles Nicaise (NARILIS)